TY  - JOUR
AU  - Kamran, A.
AU  - Moradi Gheisvandi, Z.
TI  - Automatic Test Pattern Generation for Digital Combinational Circuits Using an Approximate Parallel Pattern Critical Path Tracing Index
JO  - Nashriyyah -i Muhandisi -i Barq va Muhandisi -i Kampyutar -i Iran
VL  - 23
IS  - 3
SP  - 198
EP  - 208
PY  - 2026
DO  - 
ER  -